Sample positioning device of x-ray stress measuring instrument

Abstract

PURPOSE: To efficiently perform the positioning work of a sample without damaging the surface of the sample by transferring the sample so that the detected output of the fluorescent X-rays emitted from the sample is made maximum. CONSTITUTION: The sorted peak value of a pulse height analyzer 8 is set to the energy value of characteristic X-rays of the main element of a sample. The initial position of an X-ray detector 6 is made arbitrary but it is convenient that the position on a goniometer G is set to the direction dislocated from the direction of the diffracted X-rays predicated for the sample. When the sample is measured while lowering this sample to the position C from the posi tion A, a counting curve is obtained. The sample can be automatically set to the right position when the sample is fixed to the position equivalent to the peak vertex of this counting curve. COPYRIGHT: (C)1990,JPO&Japio

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Cited By (9)

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    JP-2007017350-AJanuary 25, 2007Shimadzu Corp, 株式会社島津製作所X線分析装置
    JP-2007163262-AJune 28, 2007Riken Keiki Co Ltd, 理研計器株式会社エックス線分析装置
    JP-2008039559-AFebruary 21, 2008Riken Keiki Co Ltd, 理研計器株式会社エックス線分析装置
    JP-2008039560-AFebruary 21, 2008Riken Keiki Co Ltd, 理研計器株式会社X-ray analyzer
    JP-2008111781-AMay 15, 2008Riken Keiki Co Ltd, 理研計器株式会社Measuring treatment method of x-ray analyzer
    JP-2008111782-AMay 15, 2008Riken Keiki Co Ltd, 理研計器株式会社X-ray analyzer
    JP-4619282-B2January 26, 2011理研計器株式会社エックス線分析装置
    JP-4664265-B2April 06, 2011理研計器株式会社エックス線分析装置
    WO-2007069639-A1June 21, 2007Riken Keiki Co., Ltd.Analyseur a rayons x